Title

Extensions of molecular ruler technology for nanoscale patterning

ACS Citation

Srinivasan, C.; Anderson, M.E.; Carter, E.M.; Hohman, J.N.; Bharadwaja, S.S.N.; Trolier-McKinstry, S.; Weiss, P.S.; Horn, M.W. Extensions of Molecular Ruler Technology for Nanoscale Patterning. J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct. -- Process., Meas., Phenom.2006,24, 3200-3204.

Abstract

By combining optical lithography and chemical self-assembly, the authors circumvent the limitations of photolithography and provide a parallel, low-cost alternative to fabricate sub-50 nm features. Self-assembled multilayers, composed of alternating layers of α,ω-mercaptoalkanoic acids and copper (II) ions (“molecular rulers”), are used as an organic sidewall spacer resist on initial lithographic structures enabling the precise, proximal placement of a secondary structure via lift-off. Here, the authors implemented a positive-tone bilayer resist for improved line-edge characteristics of the secondary structure and evaluated the lithographic and electrical performance of nanostructures fabricated using this approach. Additionally, they describe extensions of this technique by which planar nanojunctions were created, and the generated nanometer-scale pattern was transferred to the underlying substrate.

Source Name

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena

Publication Date

12-4-2006

Volume

24

Issue

6

Page(s)

3200-3204

Document Type

Citation

Citation Type

Article

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